The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2018

Filed:

Apr. 16, 2014
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Wolf Jockusch, Gottingen, DE;

Robert Schrem, Stuttgart, DE;

Peter Weber, Altensteig, DE;

Alexander Gaiduk, Jena, DE;

Dominik Stehr, Jena, DE;

Benno Radt, Jena, DE;

Markus Gnauck, Jena, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/24 (2006.01); G02B 21/36 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G02B 21/24 (2013.01); H04N 5/23216 (2013.01);
Abstract

The invention relates to a control device and to a method for controlling a motorized digital microscope. The control device comprises at least one first module () for controlling the hardware, the software and the work flow of the digital microscope during the examination of a specimen. According to the invention, the first module () comprises a first input means () having force feedback for controlling functions of the digital microscope. In a method according to the invention, data input takes place via a first input means, wherein force feedback is generated via the success or progression of the input.


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