The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Jan. 12, 2018
Carl Zeiss Microscopy Gmbh, Jena, DE;
Alexander Gaiduk, Jena, DE;
Dominik Stehr, Jena, DE;
Johannes Winterot, Jena, DE;
Volker Pusch, Hüttlingen, DE;
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Abstract
The present invention relates to a method for viewing a specimen using a microscope which comprises an objective lens and an image sensor for converting an image formed on the image sensor by the objective lens. A field of view of the microscope can be varied by selecting a section of the image sensor. In one step of the method, an initial image of at least a partial section of the specimen is captured with the microscope, for which a first field of view is selected on the microscope. The initial image is analyzed to determine at least two differing fields of view forming a partial area image, wherein a partial area of the initial image is formed by each of the fields of view forming a partial area image. Images of the partial areas of the specimen are captured for each of the determined fields of view forming a partial area image. The invention further relates to a microscope for viewing a specimen using a microscope.