This inventor holds 2 USPTO granted patents. Top assignees: Leica Microsystems Jena Gmbh, Vistec Semiconductor Systems Gmbh. Active years: 2002-2007.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Jena-Wogau, DE (2002)
- Jenapriessnitz, DE (2007)
Company Filing History:
Years Active: 2002-2007
Title: Detlef Wolter: Innovator in Optical Measurement Systems
Introduction
Detlef Wolter is a notable inventor based in Jenapriessnitz, Germany. He has made significant contributions to the field of optical measurement systems, holding two patents that showcase his innovative approach to technology.
Latest Patents
One of his latest patents is a measurement system with an optical measurement arrangement. This invention focuses on an optical measurement arrangement designed for examining layer systems. It includes an illumination device with at least one illumination source that delivers a measurement light beam and couples it into the beam path of a layer thickness measuring instrument. The illumination device can be housed in a lamp housing that is detachably connected to the rest of the measurement arrangement, allowing for pre-alignment of illumination sources with respect to the beam path.
Another significant patent is a method and apparatus for monitoring the light emitted from an illumination apparatus for an optical measuring instrument. This method involves continuous sensing of measurement light parameters, which are then compared to predefined setpoints. Any deviation from these setpoints triggers a signal that initiates a lamp exchange on the illumination apparatus. This system is designed to maintain consistent measurement light quality during continuous operation, ensuring optimal measurement accuracy.
Career Highlights
Detlef Wolter has worked with prominent companies in the field, including Leica Microsystems Jena GmbH and Vistec Semiconductor Systems Jena GmbH. His experience in these organizations has contributed to his expertise in optical measurement technologies.
Collaborations
Throughout his career, Detlef has collaborated with notable colleagues such as Matthias Slodowski and Joachim Wienecke. These partnerships have further enriched his work and innovations in the field.
Conclusion
Detlef Wolter's contributions to optical measurement systems through his patents and career experiences highlight his role as an influential inventor. His work continues to impact the industry positively, ensuring advancements in measurement technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile