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For the Inventor, By the Inventor

Sewell, NJ, United States of America

David W Wilz, Sr

This inventor holds 8 USPTO granted patents. Top assignee: Metrologic Instruments, Inc.. Active years: 2005-2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David W Wilz, Sr. Retrieved from https://idiyas.com/inventor/david-w-wilz-sr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 8

Average Co-Inventor Count = 26.9

ph-index = 5

Forward Citations = 96(Granted Patents)


Company Filing History:

goldMedal8 out of 649 
 
Metrologic Instruments, Inc.
 patents

Years Active: 2005-2010

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8 patents (USPTO):Explore Patents
1. 7832643 - Hand-supported planar laser illumination and imaging (PLIIM) based systems with laser despeckling mechanisms integrated therein (2010-11-16),
2. 7673803 - Planar laser illumination and imaging (PLIIM) based engine (2010-03-09),
3. 7584893 - Tunnel-type digital imaging system for use within retail shopping environments such as supermarkets (2009-09-08),
4. 7581681 - Tunnel-type digital imaging system for use within retail shopping environments such as supermarkets (2009-09-01),
5. 7527200 - Planar laser illumination and imaging (PLIIM) systems with integrated despeckling mechanisms provided therein (2009-05-05),
6. 7070106 - Internet-based remote monitoring, configuration and service (RMCS) system capable of monitoring, configuring and servicing a planar laser illumination and imaging (PLIIM) based network (2006-07-04),
7. 6978936 - Method of and system for automatically producing digital images of moving objects, with pixels having a substantially uniform white level independent of the velocities of the moving objects (2005-12-27),
8. 6978935 - PLANAR LIGHT ILLUMINATION AND IMAGING (PLIIM) BASED SYSTEM HAVING A LINEAR IMAGE DETECTION CHIP MOUNTING ASSEMBLY WITH MEANS FOR PREVENTING MISALIGNMENT BETWEEN THE FIELD OF VIEW (FOV) OF SAID LINEAR IMAGE DETECTION CHIP AND THE CO-PLANAR LASER ILLUMINATION BEAM (PLIB) PRODUCED BY SAID PLIIM BASED SYSTEM, IN RESPONSE TO THERMAL EXPANSION AND/OR CONTRACTION WITHIN SAID PLIIM BASED SYSTEM (2005-12-27),

Title: Unveiling the Innovations of David W Wilz, Sr.

Introduction:

David W Wilz, Sr., a brilliant inventor hailing from Sewell, NJ (US), has made significant contributions in the field of technology with a total of 8 patents to his name. His groundbreaking work at Metrologic Instruments, Inc. has shaped the landscape of imaging and code symbol reading technologies.

Latest Patents:

Among David W Wilz, Sr.'s notable patents is the Hand-supported planar laser illumination and imaging (PLIIM) based systems with laser despeckling mechanisms integrated therein. This invention revolutionizes code symbol reading by employing a hand-supportable device with sophisticated image processing capabilities.

Another remarkable patent by Wilz is the Planar laser illumination and imaging (PLIIM) based engine, which encompasses innovative elements like a laser despeckling mechanism to enhance imaging precision and reduce noise during object illumination processes.

Career Highlights:

David W Wilz, Sr.'s journey as an inventor has been highlighted by a relentless pursuit of excellence in the realm of laser technologies. His creative solutions have not only earned him patents but also established him as a thought leader in the industry.

Collaborations:

Throughout his career, David W Wilz, Sr. has collaborated with esteemed professionals such as Constantine J Tsikos and C Harry Knowles. These partnerships have fostered a culture of innovation and knowledge sharing, leading to groundbreaking advancements in the field of laser technology.

Conclusion:

In conclusion, David W Wilz, Sr.'s inventive spirit and penchant for technological innovation have significantly impacted the realm of laser illumination and imaging systems. His patents stand as a testament to his ingenuity and unwavering commitment to pushing the boundaries of what is possible in the world of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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