The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2006
Filed:
Oct. 31, 2001
C. Harry Knowles, Moorestown, NJ (US);
Mark C. Schmidt, Williamstown, NJ (US);
Xiaoxun Zhu, Marlton, NJ (US);
Shawn Defoney, Runnemede, NJ (US);
Edward Skypala, Blackwood, NJ (US);
Constantine J. Tsikos, Voorhees, NJ (US);
Ka Man AU, Philadelphia, PA (US);
Barry E. Schwartz, Haddonfield, NJ (US);
Allan Wirth, Bedford, MA (US);
Andrew Jankevics, Westford, MA (US);
Timothy A. Good, Clementon, NJ (US);
Sankar Ghosh, Glenolden, PA (US);
Michael D. Schnee, Aston, PA (US);
George Kolis, Pennsauken, NJ (US);
Thomas Amundsen, Turnersville, NJ (US);
Charles A. Naylor, Sewell, NJ (US);
Robert Blake, Woodbury Heights, NJ (US);
Russell Joseph Dobbs, Cherry Hill, NJ (US);
Jeffery Yorsz, Winchester, MA (US);
Patrick A. Giordano, Blackwood, NJ (US);
Stephen J. Colavito, Brookhaven, PA (US);
David W. Wilz, Sr., Sewell, NJ (US);
William Svedas, Deptford, NJ (US);
Steven Y. Kim, Cambridge, MA (US);
Dale M. Fischer, Voorhees, NJ (US);
Jon Van Tassell, Winchester, MA (US);
C. Harry Knowles, Moorestown, NJ (US);
Mark C. Schmidt, Williamstown, NJ (US);
Xiaoxun Zhu, Marlton, NJ (US);
Shawn Defoney, Runnemede, NJ (US);
Edward Skypala, Blackwood, NJ (US);
Constantine J. Tsikos, Voorhees, NJ (US);
Ka Man Au, Philadelphia, PA (US);
Barry E. Schwartz, Haddonfield, NJ (US);
Allan Wirth, Bedford, MA (US);
Andrew Jankevics, Westford, MA (US);
Timothy A. Good, Clementon, NJ (US);
Sankar Ghosh, Glenolden, PA (US);
Michael D. Schnee, Aston, PA (US);
George Kolis, Pennsauken, NJ (US);
Thomas Amundsen, Turnersville, NJ (US);
Charles A. Naylor, Sewell, NJ (US);
Robert Blake, Woodbury Heights, NJ (US);
Russell Joseph Dobbs, Cherry Hill, NJ (US);
Jeffery Yorsz, Winchester, MA (US);
Patrick A. Giordano, Blackwood, NJ (US);
Stephen J. Colavito, Brookhaven, PA (US);
David W. Wilz, Sr., Sewell, NJ (US);
William Svedas, Deptford, NJ (US);
Steven Y. Kim, Cambridge, MA (US);
Dale M. Fischer, Voorhees, NJ (US);
Jon Van Tassell, Winchester, MA (US);
Metrologic Instruments, Inc., Blackwood, NJ (US);
Abstract
An Internet-based remote monitoring, configuration and service (RMCS) system capable of monitoring, configuring and servicing a planar laser illumination and imaging (PLIIM) based network. The network has one or more nodes and performs object identification and attribute acquisition functions. Each node is a PLIIM-based subsystem operably connected to a digital communications network interconnectable to the infrastructure of the Internet. The Internet-based RMCS system comprises a monitoring subsystem for remotely monitoring a set parameters associated with the PLIIM-based network. The set of parameters relate to network, system and/or subsystem characteristics of the PLIIM-based network. The RMCS also includes an analyzing subsystem for remotely analyzing the parameters to diagnose (i) performance failures in the PLIIM-based network, as well as (ii) the operation and performance of the PLIIM-based network. The RMCS also includes a control subsystem for remotely controlling one or more of the parameters so as to improve the performance of the PLIIM-based network and/or provide service thereto from a remote location.