The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2009
Filed:
Oct. 30, 2007
Constantine J. Tsikos, Voorhees, NJ (US);
C. Harry Knowles, Moorestown, NJ (US);
Xiaoxun Zhu, Marlton, NJ (US);
Michael D. Schnee, Aston, PA (US);
Ka Man AU, Philadelphia, PA (US);
Allan Wirth, Bedford, MA (US);
Timothy A. Good, Clementon, NJ (US);
Andrew Jankevics, Westford, MA (US);
Sankar Ghosh, Glenolden, PA (US);
Charles A. Naylor, Sewell, NJ (US);
Thomas Amundsen, Turnersville, NJ (US);
Robert Blake, Woodbury Heights, NJ (US);
William Svedas, Deptford, NJ (US);
Shawn Defoney, Runnemede, NJ (US);
Edward Skypala, Blackwood, NJ (US);
Pirooz Vatan, Wilmington, MA (US);
Russell Joseph Dobbs, Cherry Hill, NJ (US);
George Kolis, Pennsauken, NJ (US);
Mark C. Schmidt, Williamstown, NJ (US);
Jeffery Yorsz, Winchester, MA (US);
Patrick A. Giordano, Blackwood, NJ (US);
Stephen J. Colavito, Brookhaven, PA (US);
David W. Wilz, Sr., Sewell, NJ (US);
Barry E. Schwartz, Haddonfield, NJ (US);
Steven Y. Kim, Cambridge, MA (US);
Dale Fisher, Voorhees, NJ (US);
Jon Van Tassell, Winchester, MA (US);
Constantine J. Tsikos, Voorhees, NJ (US);
C. Harry Knowles, Moorestown, NJ (US);
Xiaoxun Zhu, Marlton, NJ (US);
Michael D. Schnee, Aston, PA (US);
Ka Man Au, Philadelphia, PA (US);
Allan Wirth, Bedford, MA (US);
Timothy A. Good, Clementon, NJ (US);
Andrew Jankevics, Westford, MA (US);
Sankar Ghosh, Glenolden, PA (US);
Charles A. Naylor, Sewell, NJ (US);
Thomas Amundsen, Turnersville, NJ (US);
Robert Blake, Woodbury Heights, NJ (US);
William Svedas, Deptford, NJ (US);
Shawn Defoney, Runnemede, NJ (US);
Edward Skypala, Blackwood, NJ (US);
Pirooz Vatan, Wilmington, MA (US);
Russell Joseph Dobbs, Cherry Hill, NJ (US);
George Kolis, Pennsauken, NJ (US);
Mark C. Schmidt, Williamstown, NJ (US);
Jeffery Yorsz, Winchester, MA (US);
Patrick A. Giordano, Blackwood, NJ (US);
Stephen J. Colavito, Brookhaven, PA (US);
David W. Wilz, Sr., Sewell, NJ (US);
Barry E. Schwartz, Haddonfield, NJ (US);
Steven Y. Kim, Cambridge, MA (US);
Dale Fisher, Voorhees, NJ (US);
Jon Van Tassell, Winchester, MA (US);
Metrologic Instruments, Inc., Blackwood, NJ (US);
Abstract
A tunnel-type digital imaging system for use within retail shopping environments such as supermarkets. The system includes a tunnel configuration arranged about a conveyor structure for transporting objects therethrough, and an image capturing and processing subsystem embodied within the tunnel configuration, for generating a 3D digital imaging volume above the conveyor structure and within the tunnel configuration, for capturing digital 1D images of objects transported through the 3D imaging volume. The image capturing and processing subsystem includes a plurality of coplanar illumination and imaging stations. Each station includes a linear imaging array having optics providing a field of view (FOV) on the linear imaging array that is projected and extends into the 3D imaging volume, and one or more light emitting devices configured together to produce a substantially planar illumination beam (PLIB) that extends in substantially along the same plane as the FOV of the linear imaging array so that each the linear imaging array and corresponding one or more light emitting devices produce at least one coplanar illumination and imaging plane that projects into the 3D imaging volume. A digital image processing subsystem processing digital 1D images of objects passing through the 3D imaging volume, and a system control subsystem controls and/or orchestrates the coplanar illumination and imaging subsystems during system operation.