The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2010
Filed:
Oct. 30, 2007
Constantine J. Tsikos, Voorhees, NJ (US);
C. Harry Knowles, Moorestown, NJ (US);
Xiaoxun Zhu, Marlton, NJ (US);
Michael D. Schnee, Aston, PA (US);
Ka Man AU, Philadelphia, PA (US);
Allan Wirth, Bedford, MA (US);
Timothy A. Good, Clementon, NJ (US);
Andrew Jankevics, Westford, MA (US);
Sankar Ghosh, Glenolden, PA (US);
Charles A. Naylor, Sewell, NJ (US);
Thomas Amundsen, Turnersville, NJ (US);
Robert Blake, Woodbury Heights, NJ (US);
William Svedas, Deptford, NJ (US);
Shawn Defoney, Runnemede, NJ (US);
Edward Skypala, Blackwood, NJ (US);
Pirooz Vatan, Wilmington, MA (US);
Russell Joseph Dobbs, Cherry Hill, NJ (US);
George Kolis, Pennsauken, NJ (US);
Mark S. Schmidt, Williamstown, NJ (US);
Jeffery Yorsz, Winchester, MA (US);
Patrick A. Giordano, Blackwood, NJ (US);
Stephen J. Colavito, Brookhaven, PA (US);
David W. Wilz, Sr., Sewell, NJ (US);
Barry E. Schwartz, Haddonfield, NJ (US);
Steven Y. Kim, Cambridge, MA (US);
Dale Fisher, Voorhees, NJ (US);
Jon Van Tassell, Winchester, MA (US);
Constantine J. Tsikos, Voorhees, NJ (US);
C. Harry Knowles, Moorestown, NJ (US);
Xiaoxun Zhu, Marlton, NJ (US);
Michael D. Schnee, Aston, PA (US);
Ka Man Au, Philadelphia, PA (US);
Allan Wirth, Bedford, MA (US);
Timothy A. Good, Clementon, NJ (US);
Andrew Jankevics, Westford, MA (US);
Sankar Ghosh, Glenolden, PA (US);
Charles A. Naylor, Sewell, NJ (US);
Thomas Amundsen, Turnersville, NJ (US);
Robert Blake, Woodbury Heights, NJ (US);
William Svedas, Deptford, NJ (US);
Shawn Defoney, Runnemede, NJ (US);
Edward Skypala, Blackwood, NJ (US);
Pirooz Vatan, Wilmington, MA (US);
Russell Joseph Dobbs, Cherry Hill, NJ (US);
George Kolis, Pennsauken, NJ (US);
Mark S. Schmidt, Williamstown, NJ (US);
Jeffery Yorsz, Winchester, MA (US);
Patrick A. Giordano, Blackwood, NJ (US);
Stephen J. Colavito, Brookhaven, PA (US);
David W. Wilz, Sr., Sewell, NJ (US);
Barry E. Schwartz, Haddonfield, NJ (US);
Steven Y. Kim, Cambridge, MA (US);
Dale Fisher, Voorhees, NJ (US);
Jon Van Tassell, Winchester, MA (US);
Metrologic Instruments, Inc., Blackwood, NJ (US);
Abstract
A planar laser illumination and imaging (PLIIM) based engine including; an engine housing having light transmission aperture; an image formation and detection module and having an image detection array and image formation optics with a field of view (FOV) extending from the image detection array, through the light transmission aperture and onto an object moving relative to the engine housing during object illumination and imaging operations; a planar laser illumination beam (PLIB) producing device, and having at least one visible laser illumination source arranged in relation to the image formation and detection module, for producing a planar light illumination beam (PLIB), and projecting the planar light illumination beam through light transmission aperture and oriented such that the plane of the PLIB is coplanar with the field of view of the image formation and detection module so that the object can be simultaneously illuminated by the planar light illumination beam and imaged within the field of view and onto the image detection array for detection as a digital linear image of the object; a laser despeckling mechanism for reducing the coherence of the PLIB during object illumination and imaging operation so that the power of speckle-pattern noise is substantially reduced in digital linear images detected on said image detection array.