Ganei Yehuda, Israel

David Scheiner

USPTO Granted Patents = 20 

 

Average Co-Inventor Count = 2.0

ph-index = 11

Forward Citations = 423(Granted Patents)


Location History:

  • Ganel Yehuda, IL (2005)
  • Yehuda, IL (2007)
  • Ganei Yehuda, IL (2000 - 2017)

Company Filing History:


Years Active: 2000-2017

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20 patents (USPTO):

Title: Innovations and Achievements of David Scheiner

Introduction

David Scheiner, hailing from Ganei Yehuda, Israel, is a distinguished inventor known for his significant contributions in the field of optical measurement techniques. With a remarkable portfolio of 20 patents, Scheiner has established himself as a leading figure in innovation, particularly within the realms of multilayer manufacturing and measurements.

Latest Patents

Among his most recent patents, two stand out for their innovative approaches. The first is titled "Lateral shift measurement using an optical technique." This invention focuses on aligning layers during the manufacture of multi-layer samples by utilizing optical measurements. It describes a unique measurement site comprising two diffractive structures located in different layers, which allows for the detection of lateral shifts based on the diffraction properties of the structures illuminated with polarized light.

His other notable patent is the "Optical system and method for measurement of one or more parameters of via-holes." This patented technology employs a non-destructive optical system that captures various parameters of via-holes within structures. By using an illumination system and a detection system, the invention can determine critical dimensions such as depth and width, aided by a theoretical model that enhances the accuracy of measurements.

Career Highlights

David Scheiner currently works at Nova Measuring Instruments Ltd., a company renowned for its innovations in optical inspection and measurement solutions. Throughout his career, Scheiner has relentlessly pursued advancements in technology, leading to a series of impactful patents that enhance manufacturing processes and measurement techniques.

Collaborations

In addition to his individual achievements, Scheiner collaborates with talented colleagues, including Moshe Finarov and Vladimir Machavariani. Together, they contribute to pioneering research and development initiatives aimed at pushing the boundaries of optical measurement technology.

Conclusion

David Scheiner’s contributions to the field of optical measurements and multilayer manufacturing signify a remarkable blend of innovation and practical application. With a strong foundation of patents and collaborations, he continues to shape the landscape of technology, driving forward advancements that impact various industries. His work not only exemplifies creativity but also showcases the importance of intellectual property in fostering innovation.

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