David Gready

Title: The Innovations of David Gready

Introduction

David Gready is an accomplished inventor based in Tel Aviv, Israel. He has made significant contributions to the field of imaging-based overlay measurements, holding a total of 5 patents. His work focuses on enhancing the accuracy and efficiency of metrology systems used in various applications.

Latest Patents

Gready's latest patents include a "System and method for application of harmonic detectivity as a quality indicator for imaging-based overlay measurements." This innovative system features a controller that is coupled to a metrology sub-system. The controller is designed to receive image signals from a metrology target and calculate harmonic detectivity metric values. It identifies optical measurement conditions based on these values, providing a recipe for executing optical metrology measurements.

Another notable patent is the "Hybrid overlay target design for imaging-based overlay and scatterometry-based overlay." This design incorporates both imaging-based and scatterometry-based targets within a single target area. The system includes a method for measuring this hybrid overlay target design, utilizing both an imaging optical system and a scatterometry system.

Career Highlights

Throughout his career, David Gready has worked with prominent companies in the industry, including KLA-Tencor Corporation and KLA Corporation. His experience in these organizations has allowed him to develop and refine his innovative ideas in metrology.

Collaborations

Gready has collaborated with talented individuals such as Mark Ghinovker and Nimrod Shuall. These partnerships have contributed to the advancement of his projects and the successful development of his patents.

Conclusion

David Gready's contributions to the field of imaging-based overlay measurements demonstrate his expertise and innovative spirit. His patents reflect a commitment to improving metrology systems, making significant strides in the industry.