David Foord

Title: David Foord: Innovator in Charged-Particle Microscopy

Introduction

David Foord is a notable inventor based in Portland, OR (US). He has made significant contributions to the field of charged-particle microscopy, holding a total of 4 patents. His work focuses on enhancing imaging techniques and material processing through innovative methods.

Latest Patents

Foord's latest patents include groundbreaking inventions that improve the efficiency and effectiveness of charged-particle microscopy. One of his notable patents is for "Ion implantation to alter etch rate." This invention involves implanting a material in a pattern that hardens it for subsequent etching. The result is a thicker structure remaining after etching due to the reduced etch rate of the hardened pattern. This method is particularly useful for preparing thin lamella for viewing on a transmission electron microscope.

Another significant patent is the "Method of performing tomographic imaging of a sample in a charged-particle microscope." This invention outlines a method for conducting tomographic imaging by directing a charged particle beam through a sample at various tilts. The images acquired are mathematically combined to create a composite image, which includes analyzing spectral maps to derive compositional data of the sample.

Career Highlights

David Foord is currently associated with FEI Company, where he continues to innovate in the field of microscopy. His work has been instrumental in advancing the capabilities of charged-particle imaging technologies.

Collaborations

Foord collaborates with talented individuals such as Brian Routh, Jr. and Peter Christiaan Tiemeijer. Their combined expertise contributes to the development of cutting-edge technologies in their field.

Conclusion

David Foord's contributions to charged-particle microscopy through his innovative patents have significantly impacted the field. His work continues to pave the way for advancements in imaging techniques and material processing.