The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2017

Filed:

Sep. 09, 2013
Applicant:

Fei Company, Hillsboro, OR (US);

Inventors:

Remco Schoenmakers, Best, NL;

David Foord, Portland, OR (US);

Assignee:

FEI Company, Hillsboro, OR (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01); G01N 23/225 (2006.01); G06T 11/00 (2006.01); H01J 37/28 (2006.01); H01J 37/244 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01N 23/2251 (2013.01); G06T 11/005 (2013.01); H01J 37/28 (2013.01); G01N 2223/419 (2013.01); H01J 37/244 (2013.01); H01J 2237/226 (2013.01); H01J 2237/24485 (2013.01); H01J 2237/24585 (2013.01); H01J 2237/2611 (2013.01); H01J 2237/2802 (2013.01); H01J 2237/2807 (2013.01);
Abstract

The invention relates to a method of performing tomographic imaging involving repeatedly directing a charged particle beam through a sample for a series of sample tilts to acquire a corresponding set of images and mathematically combining the images to construct a composite image. The latter of which consists of, at each of a second series of sample tilts, using a spectral detector to accrue a spectral map of said sample, thus acquiring a collection of spectral maps; analyzing said spectral maps to derive compositional data of the sample; and employing said compositional data in constructing said composite image.


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