Campbell Hall, NY, United States of America

David C Graef

This inventor holds 23 USPTO granted patents and 2 published patent applications and 1 EPO patent, primarily in Oscilloscope Technology. Top assignees: Lecroy Corporation, Teledyne Lecroy, Inc.. Active years: 2005-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David C Graef. Retrieved from https://idiyas.com/inventor/david-c-graef

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 23 

% Patents Active = 82.6


Average Co-Inventor Count = 2.6

ph-index = 11

Forward Citations = 278(Granted Patents)


Company Filing History:


Years Active: 2005-2020

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Areas of Expertise:
Oscilloscope
High Bandwidth
Variable Resolution
Trigger Scanning
Measurement Instrument
Analog Signal
Digitizing Components
Real-Time Processing
Multiple Trigger Paths
Signal Digitization
23 patents (USPTO):Explore Patents

Title: The Inventor David C Graef: Pioneering Innovations in Campbell Hall, NY

Introduction: David C Graef is a distinguished inventor based in Campbell Hall, NY, known for his groundbreaking contributions to various fields through his innovative creations.

Latest Patents: David C Graef holds several patents in diverse areas, showcasing his versatility and ingenuity in inventing new solutions to complex problems.

Career Highlights: Throughout his illustrious career, David C Graef has consistently pushed the boundaries of innovation, earning recognition for his exceptional creativity and problem-solving skills.

Collaborations: David C Graef has collaborated with leading companies, research institutions, and universities, leveraging his expertise to drive forward cutting-edge projects and developments.

Conclusion: David C Graef's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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