The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2013

Filed:

Mar. 06, 2012
Applicants:

Anthony Cake, Givrins, CH;

Peter J Pupalaikis, Ramsey, NJ (US);

David Graef, Campbell Hall, NY (US);

William Driver, Warwick, NY (US);

Michael Hertz, Washington Township, MI (US);

Laxmikant Joshi, Palo Alto, CA (US);

Inventors:

Anthony Cake, Givrins, CH;

Peter J Pupalaikis, Ramsey, NJ (US);

David Graef, Campbell Hall, NY (US);

William Driver, Warwick, NY (US);

Michael Hertz, Washington Township, MI (US);

Laxmikant Joshi, Palo Alto, CA (US);

Assignee:

Teledyne LeCroy, Inc., Thousand Oaks, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for determining a trigger in a test and measurement apparatus are provided. The method comprises the steps of loading a first trigger configuration to a first trigger element of the test and measurement apparatus and loading a second trigger configuration to a second trigger element of the test and measurement apparatus so that these trigger elements operate substantially simultaneously, It is then determined whether the input signal generates a trigger in accordance with the one or more trigger configurations.


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