For the Inventor, By the Inventor

Enter assignee name

Chestnut Ridge, NY, United States of America

Lecroy Corporation

Calculating rank

USPTO Granted Patents = 130

% Expired Patents = 6.2

EPO Patents = 1

Trademarks = 16

Forward Citations = 1,451

Loading Chart...

Loading Chart...

78 inventors (with patents filed for the assignee):

Julie A Campbell (30 out of 57 patents)

Peter James Pupalaikis (28 out of 69 patents)

Lawrence W Jacobs (14 out of 36 patents)

4. David C Graef (13 out of 23 patents)

5. Martin Miller (10 out of 10 patents)

6. Stephen Mark Sekel (10 out of 10 patents)

7. Lawrence Steven Salant (8 out of 8 patents)

8. Gilles Ritter (7 out of 7 patents)

9. Keith Michael Roberts (6 out of 6 patents)

10. Anthony R Cake (6 out of 9 patents)

11. Thierry Campiche (5 out of 5 patents)

12. Joseph M Schachner (5 out of 5 patents)

13. Mark S Gorbics (5 out of 6 patents)

14. Michael G Hertz (4 out of 7 patents)

15. Satoshi Hayasaka (4 out of 40 patents)

Core Competencies:

High Bandwidth Oscilloscope

Digital Signal Processing

Probing Techniques

Electrical Test Probes

Signal Transmission

Data Analysis

Bit Error Rate

Thermal Compensation

Modular Probes

Signal Synchronization

Virtual Probing

Measurement Systems

130 patents: Sort by Forward Citations

1. 9140724 - Compensating resistance probing tip optimized adapters for use with specific electrical test probes (2015-09-22),

2. 8214163 - Envelope generation algorithm (2012-07-03),

3. 8190392 - Method and apparatus for multiple trigger path triggering (2012-05-29),

4. 8170820 - Virtual probing (2012-05-01),

5. 8134377 - Adherable holder and locater tool (2012-03-13),

6. 8098078 - Probing blade with conductive connector for use with an electrical test probe (2012-01-17),

7. 8073656 - High bandwidth oscilloscope for digitizing an analog signal having a bandwidth greater than the bandwidth of digitizing components of the oscilloscope (2011-12-06),

8. RE42809 - Method and apparatus for increasing bandwidth in sampled systems (2011-10-03),

9. 7965764 - Simultaneous physical and protocol layer analysis (2011-06-21),

10. 7957938 - Method and apparatus for a high bandwidth oscilloscope utilizing multiple channel digital bandwidth interleaving (2011-06-07),

11. 7941575 - Pause request processing for data traffic modification (2011-05-10),

12. 7940077 - Adjustable resistance (2011-05-10),

13. 7899638 - Estimating bit error rate performance of signals (2011-03-01),

14. 7865319 - Fixture de-embedding method and system for removing test fixture characteristics when calibrating measurement systems (2011-01-04),

15. 7839964 - Bit pattern synchronization in acquired waveforms (2010-11-23),

Company Overview

Lecroy Corporation, based in Chestnut Ridge, NY, specializes in the development and manufacturing of high bandwidth oscilloscopes and related technologies. The company focuses on advanced digital signal processing, probing techniques, and electrical test probes, enabling precise signal transmission and data analysis. Lecroy's expertise extends to critical areas such as bit error rate testing and thermal compensation, making it a key player in the field of electronic measurement and testing solutions.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

130 Patents

#1 in Chestnut Ridge, NY

#188 in New York

#2,986 in US

#6,189 in the World

Chestnut Ridge, NY, United States of America

Lecroy Corporation

Forward Citations = 1,451

78 inventors:

Julie A Campbell (30 out of 57 patents)

Peter James Pupalaikis (28 out of 69 patents)

Lawrence W Jacobs (14 out of 36 patents)

4. David C Graef (13 out of 23 patents)

5. Martin Miller (10 out of 10 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Lecroy Corporation. Retrieved from https://idiyas.com/company/lecroy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

Loading…