The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2013
Filed:
Jun. 27, 2008
Anthony Cake, Givrins, CH;
Peter Pupalaikis, Ramsey, NJ (US);
David Graef, Campbell Hall, NY (US);
William Driver, Warwick, NY (US);
Michael Hertz, Washington Township, MI (US);
Laxmikant Joshi, Tappan, NY (US);
Anthony Cake, Givrins, CH;
Peter Pupalaikis, Ramsey, NJ (US);
David Graef, Campbell Hall, NY (US);
William Driver, Warwick, NY (US);
Michael Hertz, Washington Township, MI (US);
Laxmikant Joshi, Tappan, NY (US);
Teledyne LeCroy, Inc., Thousand Oaks, CA (US);
Abstract
A method and apparatus for determining a trigger in a test and measurement apparatus are provided. The method includes the steps of indicating one or more anomalies to be found, loading a first trigger configuration to the test and measurement apparatus and determining for a first predetermined time period whether an input signal generates a trigger related to one or more of the one or more anomalies. A second trigger configuration is loaded to the test and measurement apparatus upon the conclusion of the first predetermined time, and for a second predetermined time it is determined whether the input signal generates a trigger related to one or more of the one or more anomalies.