Daniel L Cavan

Title: Innovations of Daniel L Cavan

Introduction

Daniel L Cavan is a notable inventor based in Woodside, CA (US). He holds a total of 10 patents that showcase his contributions to the field of inspection systems and semiconductor technology. His work has significantly impacted the way samples are inspected and analyzed.

Latest Patents

One of his latest patents is an "Inspection system including parallel imaging paths with multiple and selectable spectral bands." This system is designed to inspect a sample using multiple wavelengths of illumination simultaneously through parallel imaging paths. It includes detectors that can detect illumination reflected or scattered from the sample in response to different wavelengths, enhancing the accuracy of inspections.

Another significant patent is the "System and method for reducing dynamic range in images of patterned regions of semiconductor wafers." This invention involves generating illumination and using a spatial light modulator to selectively illuminate portions of a wafer's surface. It allows for precise control over the illumination pattern, improving the quality of images captured from semiconductor wafers.

Career Highlights

Daniel has worked with prominent companies such as Kla Tencor Corporation and Insystems, Inc. His experience in these organizations has contributed to his expertise in developing innovative inspection systems and methods.

Collaborations

Throughout his career, Daniel has collaborated with talented individuals, including Grace Hsiu-Ling Chen and Lawrence H Lin. These collaborations have likely enriched his work and led to further advancements in his field.

Conclusion

Daniel L Cavan's contributions to innovation in inspection systems and semiconductor technology are noteworthy. His patents reflect a commitment to enhancing the efficiency and accuracy of technological processes.