Cory Watkins

Title: **Cory Watkins: Innovator in Automated Wafer Inspection Technology**

Introduction

Cory Watkins, based in Chanhassen, MN, is an accomplished inventor holding 19 patents to his name. His innovative contributions particularly excel in the field of automated defect inspection systems for wafers, a critical technology in semiconductor manufacturing.

Latest Patents

Among his latest inventions, Cory developed an automated wafer defect inspection system designed for various types of wafers, including patterned, whole, partial, and sawn wafers. This system serves a crucial role in performing second optical inspections to identify critical defects such as metalization defects (including scratches, voids, corrosion, and bridging), diffusion defects, passivation layer defects, scribing defects, glassivation defects, as well as chips and cracks from sawing, solder bump defects, and bond pad area defects. This invention stands as a testament to Cory's dedication to improving semiconductor manufacturing processes.

Career Highlights

Cory has made significant strides in his career, working with leading companies such as Rudolph Technologies, Inc. and August Technology Corporation. His experience in these organizations has equipped him with the expertise needed to innovate and enhance wafer inspection technologies.

Collaborations

Throughout his career, Cory has collaborated with several talented individuals, including Mark Harless and Jeffrey L. O'Dell. These partnerships have likely contributed to his success and the development of his patented technologies.

Conclusion

With 19 patents and a focus on advancing automated wafer inspection systems, Cory Watkins continues to be a driving force in the field of semiconductor technology. His work not only reflects his innovative spirit but also significantly impacts manufacturing practices within the industry.