This inventor holds 5 USPTO granted patents and 3 published patent applications. Top assignee: United Microelectronics Corp.. Active years: 2017-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2017-2026
Title: Innovations of Chung-Chih Hung
Introduction
Chung-Chih Hung is a prominent inventor based in Kaohsiung, Taiwan. He has made significant contributions to the field of semiconductor technology, holding a total of 5 patents. His work focuses on enhancing semiconductor structures and methods for defect review.
Latest Patents
Chung-Chih Hung's latest patents include a semiconductor structure that features a wafer comprising a plurality of viewing fields defined thereon. This structure includes a plurality of dies defined by a scribe line formed in each viewing field, along with a plurality of mark patterns formed in the scribe line. Additionally, it incorporates a plurality of anchor patterns respectively formed in the viewing fields, with the anchor patterns being different from the mark patterns. Another notable patent is a method for reviewing defects, which also involves a semiconductor structure similar to the first, emphasizing the importance of accurate defect identification in semiconductor manufacturing.
Career Highlights
Chung-Chih Hung is currently employed at United Microelectronics Corporation, a leading company in the semiconductor industry. His role involves innovative research and development, contributing to advancements in semiconductor technology.
Collaborations
Chung-Chih Hung has collaborated with notable coworkers such as Yung-Teng Tsai and Hung-Chin Lin. Their combined expertise has fostered a productive environment for innovation and development within their projects.
Conclusion
Chung-Chih Hung's contributions to semiconductor technology through his patents and collaborations highlight his role as a key inventor in the field. His work continues to influence advancements in semiconductor structures and methods for defect review.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
