Hsinchu, Taiwan

Chun-Li Chang

This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: National Applied Research Laboratories. Active years: 2016-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chun-Li Chang. Retrieved from https://idiyas.com/inventor/chun-li-chang-o59385t5

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 4.6

ph-index = 1

Forward Citations = 4(Granted Patents)


Location History:

  • Taipei, TW (2016)
  • Chiayi County, TW (2017)
  • Hsinchu, TW (2019)

Company Filing History:


Years Active: 2016-2019

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3 patents (USPTO):Explore Patents

Title: Innovations of Chun-Li Chang

Introduction

Chun-Li Chang is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of optical measurement and material analysis, holding a total of three patents. His work focuses on developing advanced technologies that enhance measurement accuracy and efficiency.

Latest Patents

One of his latest patents is a flexible optical measuring device. This device comprises an optical distance measuring module, an optical fiber adapter, and an optical coupling module. The optical distance measuring module includes a light source, an optical receiver, and a computing unit. The optical fiber adapter connects the optical distance measuring module to the optical coupling module. The optical coupling module consists of a first optical fiber, a two-in-one optical coupler, a detector, and a second optical fiber. A measuring beam is emitted from the light source, reaching the detector. The beam then passes through the detector to the object, forming a reflected beam that returns to the detector. This process allows the computing unit to calculate the distance between the object and the detector's terminal.

Another significant patent is an apparatus for detecting the transmittance of a trench on infrared-transmittable material. This trench is located on a wafer, which is obtained after a ditching process. The apparatus enhances the contrast of an image of the wafer, allowing for automated analysis of the trench's transmittance. This innovation improves the accuracy of detecting transmittance defects, ensuring the quality of the wafer.

Career Highlights

Chun-Li Chang is currently employed at the National Applied Research Laboratories. His work at this institution has allowed him to focus on research and development in optical technologies and material sciences. His contributions have been instrumental in advancing the capabilities of optical measurement devices.

Collaborations

Chun-Li Chang has collaborated with notable colleagues, including Chi-Hung Huang and Tai-Shan Liao. These collaborations have fostered innovation and have led to the development of cutting-edge technologies in their respective fields.

Conclusion

Chun-Li Chang's innovative work in optical measurement and material analysis has made a significant impact in his field. His patents reflect a commitment to enhancing measurement accuracy and efficiency, contributing to advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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