Hsinchu, Taiwan

Ching-Wei Li

This inventor holds 2 USPTO granted patents and 4 published patent applications. Top assignee: United Microelectronics Corp.. Active years: 2026.

USPTO Granted Patents = 2 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Innovations of Ching-Wei Li

Ching-Wei Li is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of electronics, particularly in the area of electrostatic discharge protection circuits. His work is characterized by innovative designs that enhance the reliability and performance of electronic devices.

Latest Patents

Ching-Wei Li holds a patent for an "Electrostatic discharge protection circuit using GaN-based devices." This patent describes an ESD protection circuit that utilizes GaN devices. The circuit includes an ESD protection block with a first sub-block and a second sub-block. The first sub-block features a trigger connected to the gate of a power HEMT, a 2DEG resistor, and a LV-HEMT. The second sub-block is designed to be completely symmetrical to the first, ensuring that corresponding devices are coupled with each other. This innovative approach enhances the effectiveness of ESD protection in electronic applications. He has 1 patent to his name.

Career Highlights

Ching-Wei Li is currently employed at United Microelectronics Corporation, a leading semiconductor company. His role involves research and development in advanced electronic components. His expertise in GaN technology has positioned him as a key player in the field of semiconductor innovation.

Collaborations

Ching-Wei Li collaborates with Yu-Hsuan Chang, who is also a talented professional in the field. Their partnership has led to advancements in the development of electronic protection circuits.

Conclusion

Ching-Wei Li's contributions to the field of electrostatic discharge protection circuits demonstrate his innovative spirit and technical expertise. His work continues to influence the development of reliable electronic devices.

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