This inventor holds 2 USPTO granted patents. Top assignee: Industrial Technology Research Institute. Active years: 2013-2021.
Location History:
- Taipei County, TW (2013)
- Tainan, TW (2021)
Company Filing History:
Years Active: 2013-2021
Title: Innovations of Chih-Hsiang Chan
Introduction
Chih-Hsiang Chan is a notable inventor based in Tainan, Taiwan. He has made significant contributions to the field of technology, particularly in image processing and measurement apparatuses. With a total of 2 patents, his work showcases innovative solutions that enhance the functionality and efficiency of various systems.
Latest Patents
Chih-Hsiang Chan's latest patents include a 3D image labeling method based on labeling information of 2D images and a 3D image labeling device. This invention provides a comprehensive approach to labeling 3D images by utilizing a point cloud cluster module, a projection module, an integration module, and a point cloud recovery module. The device clusters multiple points of a 3D unlabeled image to generate a 3D clustered image, which is then processed to create a labeled 3D image.
Another significant patent is an apparatus for measuring conductive patterns on substrates. This invention features a first electro-optical modulator, transmission rollers, a voltage supplier, and a first image detecting system. It allows for precise measurement of conductive patterns, enhancing the capabilities of substrate analysis.
Career Highlights
Chih-Hsiang Chan is affiliated with the Industrial Technology Research Institute, where he continues to develop innovative technologies. His work has been instrumental in advancing research and applications in his field.
Collaborations
Chih-Hsiang Chan has collaborated with notable colleagues, including Chung-Hsien Yang and Po-Sheng Huang. Their combined expertise contributes to the success of their projects and innovations.
Conclusion
Chih-Hsiang Chan's contributions to technology through his patents reflect his dedication to innovation and problem-solving. His work not only advances the field but also sets a foundation for future developments in image processing and measurement technologies.
