Industrial Technology Research Institute

Chih-Hsiang Chan

Hau-Wei Wang

Po-Sheng Huang

Chung-Hsien Yang

Chih-Hao Cheng

Ding-Kun Liu

Bo-Chun Hsu

Yong-Tong Zou

A 3D image labeling device and a 3D image labeling method are provided. The 3D image labeling device includes a point cloud cluster module, a projection module, an integration module and a point cloud recovery module. The point cloud cluster module clusters multiple points of a 3D unlabeled image as one or more first point clusters according to a 3D unlabeled image and a cluster algorithm to generate a 3D clustered image. The projection module generates a first 2D image with first objects according to the 3D clustered image, wherein each first point cluster corresponds to one of the first objects. The integration module labels the first objects of the first 2D image according to one or more object frames of a 2D labeled image to generate a second 2D image. The point cloud recovery module generates a 3D labeled image according to the second 2D image.

3D image labeling method based on labeling information of 2D image and 3D image labeling device

An embodiment of the invention provides an apparatus for measuring a conductive pattern on a substrate, which includes a first electro-optical modulator surrounding at least one first detecting roller; transmission rollers for transferring the substrate and allowing direct contact of the substrate and the first electro-optical modulator; a voltage supplier for providing a bias between the first electro-optical modulator and the substrate; and a first image detecting system for receiving a first detecting light reflected from a first surface of the substrate.

Apparatus for measuring conductive pattern on substrate

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Tainan, Taiwan

Chih-Hsiang Chan