Company Filing History:
Years Active: 2015-2018
Title: Innovations of Chien-Chih Liao
Introduction
Chien-Chih Liao is a notable inventor based in Miao-Li, Taiwan. He has made significant contributions to the field of semiconductor testing, holding a total of 2 patents. His work focuses on improving the efficiency and accuracy of probe alignment in wafer testing systems.
Latest Patents
One of his latest patents is a method of test probe alignment control. This system and method are designed for aligning a probe, such as a wafer-level test probe, with wafer contacts. The exemplary method includes receiving a wafer containing a plurality of alignment contacts and a probe card with multiple probe points at a wafer test system. A historical offset correction is received, and based on this correction, an orientation value for the probe card relative to the wafer is determined. The probe card is then aligned to the wafer using this orientation value to bring a first probe point into contact with a first alignment contact. The connectivity of the first probe point and the first alignment contact is evaluated, followed by performing an electrical test of the wafer utilizing the aligned probe card. The historical offset correction is updated based on the orientation value.
Career Highlights
Chien-Chih Liao is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work has been instrumental in enhancing the testing processes that are critical for semiconductor manufacturing.
Collaborations
He has collaborated with notable coworkers, including Jui-Long Chen and Chin-Hsiang Lin, contributing to various projects that aim to advance semiconductor technology.
Conclusion
Chien-Chih Liao's innovations in probe alignment control demonstrate his commitment to improving semiconductor testing processes. His contributions are vital to the ongoing advancements in the semiconductor industry.