HSINCHU, Taiwan

Cheng-kuang Chen

This inventor holds 2 USPTO granted patents and 2 published patent applications. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Cheng-kuang Chen. Retrieved from https://idiyas.com/inventor/cheng-kuang-chen-001c5sb5

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Cheng-kuang Chen: Semiconductor Process and Photomask Innovations.

Introduction

Cheng-kuang Chen is an inventor based in Hsinchu, Taiwan. His patent work addresses semiconductor manufacturing, including exhaust cleaning and photomask inspection. The supplied information lists 2 patents.

Latest Patents

“Apparatus and Methods for Exhaust Cleaning” describes equipment for cleaning the exhaust path of a semiconductor process tool. The disclosed system includes a movable residue remover within an exhaust pipe section and a downstream gas-liquid separator. Deflectors positioned around a gas-exhaust port help guide the flow through the separator.

“Photomask and Method for Inspecting Photomask” describes a photomask with multiple pattern areas and an adjacent training area. A training feature is designed to be comparable to a mask feature, supporting inspection of photomask patterns.

Career Highlights

Chen’s listed company affiliations include Taiwan Semiconductor Manufacturing Company Limited. His patent subjects reflect work related to semiconductor process equipment and photomask inspection.

Collaborations

The supplied information names Chien-hung Lai and Hao-ming Chang as Chen’s coworkers. It does not specify their roles in the listed patents.

Conclusion

Cheng-kuang Chen’s listed inventions focus on practical challenges in semiconductor manufacturing, particularly exhaust-path cleaning and photomask inspection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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