Seoul, South Korea

Byung Mok Kim

USPTO Granted Patents = 32 

 

Average Co-Inventor Count = 4.6

ph-index = 6

Forward Citations = 95(Granted Patents)


Company Filing History:


Years Active: 2014-2022

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32 patents (USPTO):Explore Patents

Title: Byung Mok Kim: Innovator in Three-Dimensional Shape Detection

Introduction

Byung Mok Kim, located in Seoul, KR, is an esteemed inventor with an impressive portfolio of 32 patents. His innovative work primarily focuses on methods for generating three-dimensional shape information and defect detection, pushing the boundaries of optical and holographic technologies.

Latest Patents

Among his latest patents, Byung Mok Kim has developed groundbreaking methods that include a "Method for generating three-dimensional shape information of object to be measured" and a "Defect detection method and defect detection device." The method for generating 3D shape information involves checking frequency components within images of object holograms and extracting real image components, leading to the production of curvature aberration correction information. Furthermore, the holographic reconstruction apparatus he has created improves upon existing methods by enhancing the generation of digital reference light and compensating for curvature aberrations from holograms. This meticulous approach results in accurate 3D shape and quantitative thickness information of measurement target objects.

Career Highlights

Byung Mok Kim has contributed his expertise to several renowned companies, including LG Innotek Co., Ltd. and Naeilhae Co., Ltd. His experiences within these organizations have allowed him to refine his skills and advance innovative technologies in the fields of optics and holography.

Collaborations

Collaborating with other distinguished professionals, such as Su Jung Jung and Hiroshi Kodaira, Byung Mok Kim has shared his insights and knowledge, further enhancing the scope of his inventive work and influencing the development of novel technologies in his field.

Conclusion

Byung Mok Kim's remarkable contributions to the development of 3D shape detection and defect identification underline his role as a leading inventor in modern optical sciences. With his extensive patent portfolio, he continues to pave the way for significant advancements in the industry, showcasing the importance of innovation and collaboration in technology development.

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