The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Feb. 25, 2020
Applicant:
Naeilhae, Co., Ltd., Seongnam-si, KR;
Inventors:
Byung Mok Kim, Seoul, KR;
Mal Eum Sung, Seoul, KR;
Seong Jin Park, Seoul, KR;
Sang Jin Lee, Seoul, KR;
Assignee:
Naeilhae, Co., Ltd., Seongnam-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03H 1/04 (2006.01); G03H 1/02 (2006.01);
U.S. Cl.
CPC ...
G03H 1/0402 (2013.01); G03H 1/02 (2013.01); G03H 1/0465 (2013.01); G03H 2001/0212 (2013.01); G03H 2001/0216 (2013.01); G03H 2001/0469 (2013.01); G03H 2222/12 (2013.01); G03H 2223/24 (2013.01);
Abstract
The present disclosure relates to improved holographic reconstruction device and a method. In one aspect, the present disclosure relates to improved holographic reconstruction device and method that can measure a digital hologram regardless of optical characteristics of an object to be measured, by an all-in-one type system integrating a transmissive system that measures an object transmitting light and a reflective system that measures an object reflecting light.