The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Dec. 04, 2017
Applicant:

Naeilhae, Co. Ltd., Seongnam-si, KR;

Inventors:

Byung Mok Kim, Seoul, KR;

Mal Eum Sung, Seoul, KR;

Seong Jin Park, Seoul, KR;

Sang Jin Lee, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03H 1/04 (2006.01); G02B 27/10 (2006.01); G03H 1/08 (2006.01); G03H 1/10 (2006.01); G03H 1/16 (2006.01); G03H 1/22 (2006.01); G03H 1/00 (2006.01);
U.S. Cl.
CPC ...
G03H 1/0443 (2013.01); G02B 27/1006 (2013.01); G03H 1/0866 (2013.01); G03H 1/10 (2013.01); G03H 1/16 (2013.01); G03H 1/2202 (2013.01); G03H 2001/005 (2013.01); G03H 2001/0883 (2013.01); G03H 2222/12 (2013.01); G03H 2223/14 (2013.01); G03H 2223/24 (2013.01); G03H 2226/02 (2013.01);
Abstract

Provided are an improved holographic reconstruction apparatus and method. A holographic reconstruction method includes: obtaining an object hologram of a measurement target object; extracting reference light information from the obtained object hologram; calculating a wavenumber vector constant of the extracted reference light information, and generating digital reference light by calculating a compensation term of the reference light information by using the calculated wavenumber vector constant; extracting curvature aberration information from the object hologram, and then generating digital curvature in which a curvature aberration is compensated for; calculating a compensated object hologram by multiplying the compensation term of the reference light information by the obtained object hologram; extracting phase information of the compensated object hologram; and reconstructing 3-dimensional (3D) shape information and quantitative thickness information of the measurement target object by calculating the quantitative thickness information of the measurement target object by using the extracted phase information of the compensated object hologram.


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