Byoung-jun Min

Title: Byoung-jun Min: Innovator in Semiconductor Testing Technology

Introduction

Byoung-jun Min is a prominent inventor based in Asan-si, South Korea. He has made significant contributions to the field of semiconductor testing, holding a total of 4 patents. His work focuses on developing advanced testing apparatuses that enhance the efficiency and accuracy of semiconductor testing processes.

Latest Patents

One of his latest patents is a semiconductor test apparatus designed to streamline the testing of semiconductor chips. This apparatus includes a tray housing unit for untested and non-defective chips, a loader for positioning chips on a test tray, and a tester for conducting tests on the loaded chips. Additionally, it features an unloader that classifies tested chips and a retest controller for managing defective chips. Another notable patent involves a test socket that controls the temperature of the object being tested. This test socket is equipped with a lid, pushers to apply force to the object, and a temperature controlling member to ensure accurate testing conditions.

Career Highlights

Byoung-jun Min is currently employed at Samsung Electronics Co., Ltd., where he continues to innovate in semiconductor technology. His work has significantly impacted the efficiency of semiconductor testing, making it more reliable and effective.

Collaborations

Throughout his career, Min has collaborated with talented individuals such as Hyo-geun Chae and Jeong-ho Bang. These collaborations have further enhanced the development of innovative testing solutions in the semiconductor industry.

Conclusion

Byoung-jun Min is a key figure in the semiconductor testing field, with a focus on creating advanced testing apparatuses. His contributions have paved the way for improved testing methodologies, benefiting the semiconductor industry as a whole.