Yongin-si, South Korea

Byeonghwan Jeon

USPTO Granted Patents = 6 

Average Co-Inventor Count = 2.1

ph-index = 2

Forward Citations = 30(Granted Patents)


Location History:

  • Kyungki-do, KR (1998 - 1999)
  • Yongin-si, KR (2018 - 2020)

Company Filing History:


Years Active: 1998-2020

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6 patents (USPTO):Explore Patents

Title: Innovations by Byeonghwan Jeon

Introduction

Byeonghwan Jeon is a prominent inventor based in Yongin-si, South Korea. He has made significant contributions to the field of inspection and metrology processes, holding a total of 6 patents. His work primarily focuses on developing advanced apparatuses and methods that enhance the efficiency and accuracy of semiconductor manufacturing.

Latest Patents

One of his latest patents is an "Apparatus for and method of performing inspection and metrology process." This invention includes a stage designed to load a substrate, a sensor positioned on the stage, and an object lens that facilitates the transmission of illumination light to the substrate. The apparatus also features a first band filtering part and a second band filtering part, which control the wavelength of the illumination light within specified bandwidths.

Another notable patent is the "Inspection apparatus, semiconductor device manufacturing system including the same, and method of manufacturing a semiconductor device using the same." This invention comprises a light source device that provides incident light to a substrate, an objective lens for receiving reflection light, and a light splitting device positioned above the objective lens. Additionally, it includes first and second optical sensors and spatial filters that transmit reflection light in different forms.

Career Highlights

Byeonghwan Jeon is currently employed at Samsung Electronics Co., Ltd., where he continues to innovate and contribute to the semiconductor industry. His expertise in inspection technologies has positioned him as a key player in the development of advanced manufacturing systems.

Collaborations

He has collaborated with notable colleagues, including Kwang Soo Kim and Sangbong Park, to further enhance the capabilities of their projects and inventions.

Conclusion

Byeonghwan Jeon's contributions to the field of inspection and metrology processes have significantly impacted semiconductor manufacturing. His innovative patents and collaborative efforts continue to drive advancements in technology.

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