The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 1998
Filed:
Nov. 26, 1996
Byeonghwan Jeon, Kyungki-do, KR;
Samsung Electronics Co., Ltd., Suwon, KR;
Abstract
An apparatus for measuring the degree of inclination of an objective lens for an optical pickup is provided. The apparatus for measuring the degree of inclination of the objective lens includes a light source, a collimator positioned between the light source and the objective lens, for collimating light emitted from the light source, a condensing lens for converging light passed through the collimator on the objective lens, a light receiving element for receiving light passed through the condensing lens after being reflected from the objective lens, and an optical path converting portion positioned along the optical path between the collimator and the condensing lens, for directing part of the light entering the optical path converting portion from the light source to travel toward the condensing lens and directing the remaining light toward the light receiving element, wherein a difference between the location of the light directly entering the light receiving element after being emitted from the optical path converting portion and the location of the light entering the light receiving element after being reflected from the objective lens is detected to measure the degree of inclination of the objective lens.