This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: Fei Comapny. Active years: 2022-2026.
Company Filing History:
Years Active: 2022-2026
Title: Innovations by Brian Tilley in Integrated Circuit Testing
Introduction
Brian Tilley is an accomplished inventor based in Richardson, TX (US). He has made significant contributions to the field of integrated circuit testing, holding a total of 3 patents. His work focuses on advanced techniques that enhance the accuracy and efficiency of testing systems.
Latest Patents
Tilley's latest patents include innovative methods for detecting probe landing in integrated circuit testing systems. One of his notable inventions involves techniques for detecting a contact between a probe tip and a sample surface. This method includes dithering a probe in a plane substantially parallel to a surface using a periodic motion with a specific dither frequency. Additionally, it involves directing a beam of charged particles toward the probe and generating detector data based on the interaction between the beam and the probe. This data is crucial for detecting contact between the probe and the surface.
Another significant patent focuses on particle beam profiles for analytic equipment configuration. In this invention, beam intercept profiles are measured as a particle beam transversely scans across a probe. Various measurements, such as the current of beam particles and detector intensity, are utilized to obtain these profiles. The profiles help determine geometric parameters that can be used to configure equipment effectively. This technique is applicable to scanning electron microscopes (SEM), focused ion beams (FIB), and nanoprobe systems.
Career Highlights
Brian Tilley is currently employed at FEI Company, where he continues to innovate in the field of integrated circuit testing. His work has been instrumental in advancing the capabilities of testing systems, making them more reliable and efficient.
Collaborations
Throughout his career, Tilley has collaborated with notable colleagues, including Herman Carlo Floresca and James S. Vickers. These collaborations have contributed to the development of cutting-edge technologies in the industry.
Conclusion
Brian Tilley's contributions to integrated circuit testing through his innovative patents and collaborations highlight his significant impact on the field. His work continues to pave the way for advancements in testing technologies.