Location History:
- Rehovot, IL (1997 - 2008)
- Portland, OR (US) (2008 - 2009)
Company Filing History:
Years Active: 1997-2009
Title: Boaz Kenan: Innovator in Optical Inspection Technologies
Introduction
Boaz Kenan is a prominent inventor based in Rehovot, Israel, known for his significant contributions to the field of optical inspection technologies. With a total of 16 patents to his name, Kenan has made remarkable advancements that enhance the efficiency and accuracy of automated inspection processes.
Latest Patents
Kenan's latest patents include innovative solutions such as "Automatic optical inspection using multiple objectives." This patent describes an apparatus and techniques for automated optical inspection (AOI) that utilize image scanning modules with multiple objectives for each camera. The scanning mechanism incorporates optical components that sequentially steer optical signals from each of the multiple objectives to the corresponding camera. Another notable patent is "Method and apparatus for article inspection including speckle reduction." This invention focuses on reducing speckle during the inspection of articles used in semiconductor device manufacturing, including wafers, masks, photomasks, and reticles. The method involves reducing the coherence of a light beam output by a coherent light source, such as a pulsed laser, by incorporating various optical elements in the light path.
Career Highlights
Throughout his career, Boaz Kenan has worked with leading companies in the industry, including Applied Materials, Inc. and Scitex Inc. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to the advancement of optical inspection technologies.
Collaborations
Kenan has collaborated with notable professionals in his field, including Avner Karpol and Silviu Reinhorn. These collaborations have further enriched his work and have led to the development of cutting-edge technologies in optical inspection.
Conclusion
Boaz Kenan's contributions to optical inspection technologies have significantly impacted the semiconductor manufacturing industry. His innovative patents and collaborations with industry leaders highlight his role as a key figure in advancing automated inspection processes.