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For the Inventor, By the Inventor

Lincoln, NE, United States of America

Blaine D Johs

USPTO Granted Patents = 102

 

Average Co-Inventor Count = 3.1

ph-index = 26

Forward Citations = 2,027(Granted Patents)

Forward Citations (Not Self Cited) = 1,488(Dec 10, 2025)


Inventors with similar research interests:


Company Filing History:

goldMedal95 out of 211 
 
J.a. Woollam Co.
 patents
silverMedal4 out of 924 
 
University of Nebraska
 patents
bronzeMedal1 out of 1 
 
James D. Welch
 patent
4. 1 out of 2 
 
J.a. Woollan Co., Inc.
 patents
5. 1 out of 1 
 
Film Sense, LLC
 patent
6. 1 out of 2 
 
J.a. Wooliam Co., Inc.
 patents
7. 1 out of 832,891 
Other
 patents
where one patent can have more than one assignee

Years Active: 1994-2016

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Areas of Expertise:
Ellipsometry
Polarimetry
Spectroscopic Measurements
Sample Analysis
Beam Control
Optical Constants
Thin Film Investigation
Spatial Filtering
Automated Systems
Wavelength Mapping
Deviation Angle Compensation
Environmental Chamber Analysis
102 patents (USPTO):Explore Patents
1. 9354118 - Multiple wavelength ellipsometer system and related method (2016-05-31),
2. 9347768 - In line ellipsometer system and method of use (2016-05-24),
3. 8638437 - System and method of aligning a sample (2014-01-28),
4. 8467057 - Ellipsometers and polarimeters comprising polarization state compensating beam directing sample wobble compensating system, and method of use (2013-06-18),
5. 8462341 - Mounting for deviation angle self compensating substantially achromatic retarder (2013-06-11),
6. 8339603 - Mapping ellipsometers and polarimeters comprising polarization state compensating beam directing means, and method of use (2012-12-25),
7. 8248607 - Empirical correction for spectroscopic ellipsometric measurements of rough or textured surfaces (2012-08-21),
8. 8248606 - Sample mapping in environmental chamber (2012-08-21),
9. 8223334 - Method of improving ellipsometric and the like data (2012-07-17),
10. 8159672 - Sample investigating system and method of use (2012-04-17),
11. 8064055 - System and method of aligning a sample (2011-11-22),
12. 8013996 - Spatial filter in sample investigation system (2011-09-06),
13. 7907280 - Method of constructing a deviation angle self compensating substantially achromatic retarder to compensate beam traslation (2011-03-15),
14. 7796260 - System and method of controlling intensity of an electromagnetic beam (2010-09-14),
15. 7746472 - Automated ellipsometer and the like systems (2010-06-29),

Title: Blaine D Johs: Pioneering Innovations in Thin Film Characterization

Introduction: Blaine D Johs, a brilliant inventor based in Lincoln, NE, has made significant contributions to the field of thin film characterization. With an impressive portfolio of 102 patents, Johs is renowned for his groundbreaking work in developing advanced ellipsometer systems.

Latest Patents: Among his latest patents is a cutting-edge Multiple Wavelength Ellipsometer System. This innovative system incorporates sequentially scanned multiple light-emitting diodes or laser diodes as the light source, along with a unique polarization state detector that utilizes economical uncoated glass plates. Johs' system also includes methods to actively compensate for potential measurement errors, resulting in improved accuracy in data analysis. Additionally, his In Line Ellipsometer System offers real-time monitoring of large samples passing by the ellipsometer, enhancing efficiency in thin film analysis.

Career Highlights: Blaine D Johs has made significant strides in his career, having worked with esteemed companies such as J.A. Woollam Co. and the University of Nebraska. His dedication to research and innovation has led to the development of cutting-edge technologies in the field of thin film characterization.

Collaborations: Throughout his career, Johs has collaborated with industry experts such as Craig M Herzinger and Martin M Liphardt. These collaborations have not only enriched his research endeavors but have also paved the way for pioneering advancements in ellipsometry and thin film analysis.

Conclusion: Blaine D Johs stands as a trailblazer in the realm of thin film characterization, with a formidable patent portfolio that underscores his innovative prowess. His inventions continue to shape the landscape of scientific research and technological advancements, solidifying his legacy as an exemplary inventor in the field.

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