The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2016

Filed:

Feb. 06, 2014
Applicant:

Film Sense, Llc, Lincoln, NE (US);

Inventors:

Blaine D. Johs, Lincoln, NE (US);

Bruce A. Hadwiger, Columbus, NE (US);

Assignee:

Film Sense, LLC, Lincoln, NE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/02 (2006.01); G01N 21/21 (2006.01);
U.S. Cl.
CPC ...
G01J 4/02 (2013.01); G01N 21/211 (2013.01); G01N 2021/213 (2013.01); G01N 2021/215 (2013.01); G01N 2021/216 (2013.01);
Abstract

A multiple wavelength ellipsometer system for use in thin film characterization is disclosed. The light source for the system may include sequentially scanned multiple light emitting diodes or laser diodes. The polarization state detector may comprise no moving parts, and utilizes economical uncoated glass plates as beam splitters. The system compensates for potential measurement errors induced by misalignment of the input beam angle to the polarization state detector via a paired arrangement of the beam splitters. To provide improved accuracy in the analysis of data acquired by the system, methods herein actively compensate for the relatively large bandwidth of a preferable light emitting diode source.


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