Bruce A Hadwiger

Title: Bruce A Hadwiger: Innovator in Thin Film Characterization

Introduction

Bruce A Hadwiger is a notable inventor based in Columbus, NE (US). He has made significant contributions to the field of thin film characterization through his innovative work. His expertise and dedication to advancing technology have led to the development of a unique patent that enhances measurement accuracy.

Latest Patents

Bruce A Hadwiger holds a patent for a "Multiple wavelength ellipsometer system and related method." This system is designed for use in thin film characterization. It features a light source that may include sequentially scanned multiple light emitting diodes or laser diodes. The polarization state detector in this system comprises no moving parts and utilizes economical uncoated glass plates as beam splitters. Additionally, the system compensates for potential measurement errors induced by misalignment of the input beam angle to the polarization state detector via a paired arrangement of the beam splitters. To improve accuracy in data analysis, methods within the patent actively compensate for the relatively large bandwidth of a preferable light emitting diode source.

Career Highlights

Bruce A Hadwiger is associated with Film Sense, LLC, where he applies his innovative ideas to real-world applications. His work has been instrumental in advancing the capabilities of thin film measurement technologies.

Collaborations

Bruce collaborates with Blaine D Johs, contributing to the development of cutting-edge technologies in their field.

Conclusion

Bruce A Hadwiger's contributions to thin film characterization through his patented innovations demonstrate his commitment to advancing technology. His work continues to influence the industry and improve measurement techniques.