Company Filing History:
Years Active: 2014-2017
Title: Biow-Hiem Ong: Innovator in Defect Detection Systems
Introduction
Biow-Hiem Ong is a notable inventor based in Singapore, SG. He has made significant contributions to the field of manufacturing inspection technologies. With a total of 4 patents to his name, Ong is recognized for his innovative approaches to eliminating false defect detections in manufactured products.
Latest Patents
One of Ong's latest patents focuses on systems and methods for eliminating false defect detections. This method involves applying a first test regimen to a manufactured product to identify product defects, which produces a first set of defect candidates. Subsequently, a second test regimen is applied, which is different from the first, to identify additional product defects, resulting in a second set of defect candidates. The method culminates in generating a first filtered defect set by eliminating those candidates from the first set that are not identified in the second set.
Career Highlights
Ong is currently employed at Taiwan Semiconductor Manufacturing Company Ltd., where he continues to develop and refine his innovative solutions. His work has had a significant impact on improving the accuracy of defect detection in manufacturing processes.
Collaborations
Ong has collaborated with esteemed colleagues such as Chih-Chiang Tu and Jong-Yuh Chang, contributing to advancements in their shared field of expertise.
Conclusion
Biow-Hiem Ong's contributions to the field of defect detection systems highlight his innovative spirit and dedication to improving manufacturing processes. His work continues to influence the industry positively.