Company Filing History:
Years Active: 2016-2020
Title: Bibo Li: Innovator in Circuit Testing Technologies
Introduction
Bibo Li is a prominent inventor based in San Jose, California, known for his contributions to circuit testing technologies. With a total of five patents to his name, he has made significant advancements in the field of electronics and memory testing.
Latest Patents
One of Bibo Li's latest patents is titled "Power droop measurements using analog-to-digital converter during testing." This invention includes a functional circuit that operates in a test mode, generating respective test output patterns in response to various test stimulus patterns. The test circuit identifies specific test stimulus patterns and reapplies them multiple times while varying the start time of each reapplication in relation to the voltage level of the power supply node.
Another notable patent is the "Memory testing system," which discloses an integrated circuit that includes a memory and an interface circuit. This interface circuit is designed to receive testing signals from a built-in self-test (BIST) unit and configuration signals from automated test equipment (ATE). It issues instruction signals to the memory based on these inputs, enabling the BIST unit to detect errors in functions that it is not specifically designed to test.
Career Highlights
Bibo Li has worked with renowned companies, including Apple Inc. His experience in these high-tech environments has allowed him to refine his skills and contribute to innovative projects that push the boundaries of technology.
Collaborations
Throughout his career, Bibo has collaborated with talented individuals such as Vijay M Bettada and Bo Yang. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies.
Conclusion
Bibo Li's work in circuit testing and memory systems showcases his innovative spirit and dedication to advancing technology. His patents reflect a deep understanding of electronic systems and a commitment to improving testing methodologies.