The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Apr. 04, 2019
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Bibo Li, San Jose, CA (US);

Bo Yang, Santa Clara, CA (US);

Vijay M. Bettada, Fremont, CA (US);

Matthias Knoth, San Jose, CA (US);

Toshinari Takayanagi, San Jose, CA (US);

Assignee:

Apple Ine., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 19/00 (2006.01); H03M 1/12 (2006.01); G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31725 (2013.01); G01R 19/0038 (2013.01); G01R 31/3177 (2013.01); G01R 31/31707 (2013.01); H03M 1/1205 (2013.01);
Abstract

An apparatus includes a functional circuit, including a power supply node, and a test circuit. The functional circuit is configured to operate in a test mode that includes generating respective test output patterns in response to application of a plurality of test stimulus patterns. The test circuit is configured to identify a particular test stimulus pattern of the plurality of test stimulus patterns, and to reapply the particular test stimulus pattern to the functional circuit multiple times. The test circuit is further configured to vary, for each reapplication, a start time of the particular test stimulus pattern in relation to when a voltage level of the power supply node is sampled for that reapplication.


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