The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Dec. 05, 2016
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Dragos F. Botea, San Jose, CA (US);

Bibo Li, San Jose, CA (US);

Vijay M. Bettada, Fremont, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/10 (2006.01); G11C 29/08 (2006.01); G11C 8/06 (2006.01); G11C 11/4093 (2006.01); G11C 29/12 (2006.01); G11C 29/02 (2006.01); G11C 29/14 (2006.01); G11C 7/00 (2006.01); G11C 8/00 (2006.01); G11C 29/56 (2006.01);
U.S. Cl.
CPC ...
G11C 29/12 (2013.01); G11C 7/00 (2013.01); G11C 8/00 (2013.01); G11C 29/021 (2013.01); G11C 29/14 (2013.01); G11C 7/10 (2013.01); G11C 29/08 (2013.01); G11C 2029/5602 (2013.01);
Abstract

Techniques are disclosed relating to memory testing. In one embodiment, an integrated circuit is disclosed that includes a memory and an interface circuit. The interface circuit is configured to receive one or more testing signals from a built in self-test (BIST) unit. The interface circuit is further configured to receive, independently from the one or more testing signals, one or more configuration signals from automated test equipment (ATE). The interface circuit is further configured to issue one or more instruction signals to the memory based on the one or more testing signals and based on the one or more configuration signals. In some embodiments, the interface circuit is configured to enable the BIST unit to detect errors in functions the BIST unit is not designed to test.


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