Bernd Schindler

Title: Bernd Schindler: Innovator in Scanning Probe Microscopy

Introduction

Bernd Schindler is a notable inventor based in Aalen, Germany. He has made significant contributions to the field of microscopy, particularly in the development of methods and devices for examining electrically charged specimen surfaces. With a total of 3 patents, Schindler's work has advanced the capabilities of scanning probe microscopy.

Latest Patents

Schindler's latest patents include innovative methods for examining specimen surfaces. One of his patents focuses on a method for examining a specimen surface with a probe of a scanning probe microscope. This method involves determining the electrical potential distribution of at least one first partial region of the specimen surface and modifying the electrical potential distribution before scanning at least one second partial region. Another patent details a process for generating an image of an object using a particle beam apparatus. This apparatus includes a control unit that sets a guide unit by selecting a value of a control parameter, allowing for precise control over the landing energy of the particles.

Career Highlights

Throughout his career, Bernd Schindler has worked with prominent companies in the field of microscopy. He has been associated with Carl Zeiss SMT GmbH and Carl Zeiss Microscopy GmbH, where he has contributed to various innovative projects and advancements in microscopy technology.

Collaborations

Some of Schindler's notable coworkers include Michael Budach and Michael Schnell. Their collaborative efforts have further enriched the research and development environment in which Schindler has thrived.

Conclusion

Bernd Schindler's contributions to the field of microscopy through his patents and collaborations highlight his role as an influential inventor. His innovative methods continue to shape the future of scanning probe microscopy and its applications.