Company Filing History:
3 out of 3 
1 out of 4,872 
1 out of 75 
Years Active: 2012-2022
Title: Bernd Irmer: Innovator in Scanning Probe Microscopy
Introduction: Bernd Irmer, an accomplished inventor based in Munich, Germany, has made significant contributions to the field of scanning probe microscopy. With a portfolio of four patents, his work focuses on enhancing the capabilities and precision of atomic force microscopy through innovative methodologies and devices.
Latest Patents: Among his notable patents, Bernd Irmer's latest inventions include:
1. **Method for providing a probe device for scanning probe microscopy** – This invention outlines a method for creating a probe device specifically for atomic force microscopy. The process involves optimizing the tip geometry based on a selected basic form through computer simulations that evaluate defined measurement properties. This optimization precedes the manufacturing of the tip, culminating in a probe device capable of scanning samples with high precision and accuracy.
2. **Characterization structure for an atomic force microscope tip** – This patent describes a structure designed for the characterization of tips used in atomic force microscopy. It features a substrate with a pair of support elements and characterization elements that allow for effective evaluation of tip performance when in contact with this specialized structure.
Career Highlights: Bernd Irmer has gained experience at leading companies in the research and technology sectors. Notably, he has worked at Nanotools GmbH and the Commissariat à l'énergie atomique et aux énergies alternatives, where he contributed to advancements in nanoscale technologies.
Collaborations: Throughout his career, Bernd has collaborated with esteemed colleagues such as Volker Drexel and Ulrich Mantz. These partnerships have fostered innovation and driven the development of cutting-edge solutions in microscopic technologies.
Conclusion: Bernd Irmer's dedication to innovation in scanning probe microscopy has paved the way for significant advancements in measurement techniques and tool performance. His patents reflect a profound understanding of the complexities involved in atomic force microscopy, showcasing his role as a leading figure in this specialized field.