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For the Inventor, By the Inventor

London, United Kingdom

Benjamin Lee

This inventor holds 9 USPTO granted patents and 1 published patent application. Top assignee: Palantir Technologies Inc.. Active years: 2018-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Benjamin Lee. Retrieved from https://idiyas.com/inventor/benjamin-lee-g91tjhwv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 9 

% Patents Active = 100.0

Average Co-Inventor Count = 12.1

ph-index = 3

Forward Citations = 31(Granted Patents)


Location History:

  • Palo Alto, CA (US) (2018 - 2021)
  • London, GB (2019 - 2023)
  • Menlo Park, CA (US) (2021 - 2023)

Company Filing History:

goldMedal9 out of 1,710 
 
Palantir Technologies Inc.
 patents

Years Active: 2018-2023

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9 patents (USPTO):Explore Patents
1. 11789931 - User-interactive defect analysis for root cause (2023-10-17),
2. 11681282 - Systems and methods for determining relationships between defects (2023-06-20),
3. 11314721 - User-interactive defect analysis for root cause (2022-04-26),
4. 11126489 - Data analysis system to facilitate investigative process (2021-09-21),
5. 11106331 - Interactive display with workflow management system (2021-08-31),
6. 10839504 - User interface for managing defects (2020-11-17),
7. 10620618 - Systems and methods for determining relationships between defects (2020-04-14),
8. 10249033 - User interface for managing defects (2019-04-02),
9. 10133621 - Data analysis system to facilitate investigative process (2018-11-20),

Title: The Innovative Mind of Benjamin Lee

Introduction

Benjamin Lee is a prominent inventor based in London, GB. He has made significant contributions to the field of technology, particularly in defect analysis systems. With a total of 9 patents to his name, Lee's work has garnered attention for its innovative approach to managing defect data.

Latest Patents

One of Benjamin Lee's latest patents is focused on user-interactive defect analysis for root cause identification. This system manages defect data objects by storing a plurality of these objects and generating issue items based on user input. The system determines the similarity between defect data objects in the issue item and those stored outside of it, allowing for a more efficient analysis process. Another notable patent involves systems and methods for determining relationships between defects. This technology identifies relationships by comparing defect items based on their attributes, grouping them for further analysis, and updating a defect comparison model according to user interactions.

Career Highlights

Benjamin Lee is currently employed at Palantir Technologies Inc., where he continues to innovate and develop advanced systems for defect analysis. His work has not only advanced the field but has also provided valuable tools for users in various industries.

Collaborations

Throughout his career, Benjamin has collaborated with talented individuals such as Myles Scolnick and Arion Sprague. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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