The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
Apr. 26, 2022
Palantir Technologies Inc., Palo Alto, CA (US);
Jason Ma, Palo Alto, CA (US);
Allen Cai, Menlo Park, CA (US);
Andrew Cooper, Chicago, IL (US);
Arnaud Drizard, Paris, FR;
Benjamin Lee, Menlo Park, CA (US);
Damien Cramard, Paris, FR;
Damian Rusak, London, GB;
Hind Kraytem, London, GB;
Jan Matas, London, GB;
Ludovic Lay, Paris, FR;
Myles Scolnick, New York, NY (US);
Radu-Andrei Szasz, London, GB;
Stefan Negrus, London, GB;
Taylor Cathcart, New York, NY (US);
Zhixian Shen, New York, NY (US);
Palantir Technologies Inc., Denver, CO (US);
Abstract
Systems are provided for managing defect data objects. A system stores a plurality of defect data objects that have been input to the system, and generates an issue item including one or more defect data objects that are selected from the stored defect data objects based on user input. The system determines similarity between the one or more defect data objects in the issue item and one or more of the stored defect data objects that are out of the issue item, based on comparison of one or more parameter values. The system determines one or more candidate defect data objects to be included in the issue item from the one or more of the stored defect data objects that are out of the issue item based on the similarity, and includes one or more of the determined candidate defect data objects in the issue item based on user input.