Paris, France

Ludovic Lay


Average Co-Inventor Count = 5.8

ph-index = 2

Forward Citations = 16(Granted Patents)


Location History:

  • Zürich, CH (2022)
  • Paris, FR (2019 - 2023)
  • Zurich, CH (2023)

Company Filing History:


Years Active: 2019-2023

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6 patents (USPTO):Explore Patents

Title: Ludovic Lay: Innovator in Defect Analysis Systems

Introduction

Ludovic Lay is a prominent inventor based in Paris, France, known for his contributions to defect analysis systems. With a total of six patents to his name, he has made significant strides in improving the management and resolution of defects in software and hardware development.

Latest Patents

Ludovic's latest patents include innovative systems for user-interactive defect analysis and defect resolution. The user-interactive defect analysis patent provides a system for managing defect data objects, allowing users to input and select defect data based on similarity and user input. This system enhances the efficiency of identifying and resolving defects. His defect resolution patent outlines methods and systems for facilitating improved defect resolution by measuring defects based on defined criteria and providing a defect analysis interface that lists defects along with associated costs for resolution.

Career Highlights

Ludovic Lay is currently employed at Palantir Technologies Inc., where he applies his expertise in developing advanced defect analysis systems. His work focuses on creating solutions that streamline the defect management process, ultimately leading to more efficient software and hardware development.

Collaborations

Ludovic collaborates with talented professionals such as Hind Kraytem and Arnaud Drizard, contributing to a dynamic team environment that fosters innovation and creativity in defect analysis.

Conclusion

Ludovic Lay's contributions to defect analysis systems demonstrate his commitment to enhancing the efficiency of software and hardware development. His innovative patents and collaborative efforts position him as a key figure in the field of defect management.

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