Company Filing History:
Years Active: 2022-2023
Title: Damien Cramard: Innovator in Defect Analysis Systems
Introduction
Damien Cramard is a notable inventor based in Paris, France. He has made significant contributions to the field of defect analysis through his innovative systems. With a total of two patents to his name, Cramard is recognized for his expertise in managing defect data objects.
Latest Patents
Cramard's latest patents focus on user-interactive defect analysis for root cause identification. These systems are designed to manage defect data objects effectively. The technology involves storing a plurality of defect data objects that have been input into the system. It generates an issue item that includes one or more defect data objects selected based on user input. The system also determines the similarity between the defect data objects in the issue item and those stored outside of it, based on the comparison of parameter values. Furthermore, it identifies candidate defect data objects to be included in the issue item based on this similarity, allowing for a more comprehensive analysis.
Career Highlights
Cramard is currently employed at Palantir Technologies Inc., where he continues to develop innovative solutions in defect analysis. His work has garnered attention for its practical applications in various industries.
Collaborations
Some of Cramard's notable coworkers include Jason Ma and Allen Cai. Their collaborative efforts contribute to the advancement of technology in defect management.
Conclusion
Damien Cramard is a prominent figure in the field of defect analysis, with a focus on user-interactive systems. His contributions through patents and his role at Palantir Technologies Inc. highlight his commitment to innovation.