The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Mar. 08, 2019
Palantir Technologies Inc., Palo Alto, CA (US);
Alexander Taheri, Madison, CT (US);
Alexandru-viorel Antihi, Palo Alto, CA (US);
Arion Sprague, San Francisco, CA (US);
Benjamin Grabham, London, GB;
Benjamin Lee, London, GB;
Gregoire Omont, London, GB;
Jim Inoue, Kirkland, WA (US);
Michael Yang, New York, NY (US);
Myles Scolnick, New York, NY (US);
Pierre Lucotte, Paris, FR;
Ryan Rowe, Portola Valley, CA (US);
Tarik Benabdallah, Paris, FR;
Thomas Powell, London, GB;
Palantir Technologies Inc., Palo Alto, CA (US);
Abstract
User interfaces for managing defects are provided. A defect selection interface may include a set of defect items for selection by a user. The defect selection interface may include one or more first visuals indicating similarity of the set of defect items to other defect items. An issue selection interface may include a set of issue items for selection by the user. Individual issue items may include one or more defect items added to the individual issue items. A defect comparison interface may include a comparison of a defect item to an issue item. The defect comparison interface may include one or more second visuals indicating similarity of the defect item to the issue item. Based on the user's selection, the defect item may be added to the issue item.