The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2020
Filed:
Dec. 20, 2016
Palantir Technologies Inc., Palo Alto, CA (US);
Andrew Poh, San Francisco, CA (US);
Andre Frederico Cavalheiro Menck, New York, NY (US);
Arion Sprague, San Francisco, CA (US);
Benjamin Grabham, London, GB;
Benjamin Lee, London, GB;
Bianca Rahill-Marier, New York, NY (US);
Gregoire Omont, London, GB;
Jim Inoue, Kirkland, WA (US);
Jonah Scheinerman, Ann Arbor, MI (US);
Maciej Albin, London, GB;
Myles Scolnick, Englewood, CO (US);
Paul Gribelyuk, Jersey City, NJ (US);
Steven Fackler, Menlo Park, CA (US);
Tam-Sanh Nguyen, Olney, MD (US);
Thomas Powell, London, GB;
William Seaton, New York, NY (US);
Palantir Technologies Inc., Palo Alto, CA (US);
Abstract
Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.