Stuttgart, Germany

Benedikt Geukes

This inventor holds 18 USPTO granted patents and 3 published patent applications, primarily in Integrated Circuit Design. Top assignee: International Business Machines Corporation. Active years: 2014-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Benedikt Geukes. Retrieved from https://idiyas.com/inventor/benedikt-geukes

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 18 

% Patents Active = 33.3

Average Co-Inventor Count = 3.9

ph-index = 2

Forward Citations = 18(Granted Patents)


Location History:

  • Boeblingen, DE (2015)
  • Stuttgart, DE (2014 - 2024)

Company Filing History:


Years Active: 2014-2025

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Areas of Expertise:
Integrated Circuit
Clock Mapping
Power Supply Automation
Scan Chain Initialization
Chip Settings Protection
Self-Booting
JTAG Scanning
Boundary Scan Cells
Data Compression
Sequence Profiler
Clock Grid Alignment
Scan Access Control
18 patents (USPTO):Explore Patents

Title: Inventor Benedikt Geukes

Introduction: Benedikt Geukes is a renowned inventor based in Stuttgart, Germany, known for his groundbreaking innovations in various fields.

Latest Patents: Geukes holds several patents in the automotive industry, particularly in the development of electric vehicle technologies and autonomous driving systems.

Career Highlights: With a background in engineering, Geukes has had a successful career working for leading automotive companies in Germany, where he has contributed significantly to the advancement of sustainable transportation solutions.

Collaborations: Throughout his career, Geukes has collaborated with top researchers and engineers in the industry, fostering a culture of innovation and excellence in his projects.

Conclusion: Benedikt Geukes continues to be a driving force in the field of automotive innovation, with his work shaping the future of transportation technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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