Company Filing History:
1 out of 92 
1 out of 1 
1 out of 1 Years Active: 1999-2024
Title: Avishai Shklar: Innovator in X-ray Inspection Technology
Introduction
Avishai Shklar is a notable inventor based in Kfar Vitkin, Israel. He has made significant contributions to the field of X-ray inspection technology, holding three patents that showcase his innovative approach to enhancing inspection systems.
Latest Patents
Among his latest patents is the "Dual Source X-ray Inspection System and Method." This invention presents a system comprising at least two X-ray sources positioned and oriented at selected angles with respect to an inspection plane. This configuration provides a common illumination spot on the inspection plane, enabling the inspection of common regions of a sample with increased irradiation intensity or varying irradiation characteristics while minimizing navigation and registration processing. Another significant patent is the "Dual Head X-ray Inspection System." This system includes at least first and second inspection units positioned above a sample region. Each unit comprises at least one X-ray radiation source and a respective detector arrangement, configured for X-ray fluorescent inspection of a sample. The first and second X-ray inspection units offer different inspection properties, including variations in bandwidth of emitted X-ray energies, energy of emitted X-rays, and spot size of the X-ray beam generated on a sample.
Career Highlights
Avishai has worked with several companies, including Kulicke and Soffa Investments, Inc. and Xwinsys Technology Development Ltd. His experience in these organizations has contributed to his expertise in developing advanced inspection technologies.
Collaborations
Throughout his career, Avishai has collaborated with notable individuals such as Ofek Oiknine and Ilan Hadar. These collaborations have likely enriched his work and led to further advancements in his field.
Conclusion
Avishai Shklar's innovative contributions to X-ray inspection technology demonstrate his commitment to enhancing inspection systems. His patents reflect a deep understanding of the complexities involved in X-ray inspection, positioning him as a key figure in this technological domain.