Kulicke and Soffa Investments, Inc.

Xwinsys Technology Development Ltd.

Xwinsys Technology Developments Ltd.

Avishai Shklar

Ofek Oiknine

Kiyoshi Ogata

Ilan Hadar

Doron Reinis

Yeroslav Berezin

An X-ray inspection system and method are presented. The system comprising: at least two X-ray sources positioned and oriented at selected angles with respect to an inspection plane, to provide a common illumination spot on said inspection plane, thereby enabling inspection of common regions of a sample with at least one of increased irradiation intensity or two or more different irradiation characteristics while reducing navigation and registration processing.

Dual source X-ray inspection system and method

A sample inspection system is described. The system comprises at least first and second inspection units positioned above a sample region. Each of said at least first and second inspection unit comprises at least one X-ray radiation source and respective detector arrangement and configured for X-ray fluorescent inspection of a sample. Wherein the first and second x-ray inspection units provide first and second inspection properties different in at least one of: bandwidth of emitted X-ray energies, energy of emitted X-rays, spot size of X-ray beam generated on a sample.

Dual head X-ray inspection system

A fine pitch capillary bonding tool for making ball bonds having a consistent bonded ball size even though the air balls may vary in diameter is provided. The convential shaped bonding tool is provided with a novel ball constraining recess in the working tip. When an air ball is bonded it is forced into the constraining recess which has a shoulder portion for exerting a downward bonding force. The ball being bonded extrudes vertically into the constraining recess without laterial extrusion which would create mashed balls of varying diameter.

Fine pitch bonding tool for constrained bonding

Growing community of inventors

Kfar Vitkin, Israel

Avishai Shklar